SDCard Testing
Revision as of 12:05, 19 May 2011 by Martinlanghoff (talk | contribs)
This page discusses additional tests for SD Cards. The 'base' tests are described in NAND_Testing.
Results
Segment size vs throughput.
The first and last examples are based on numbers provided by Arnd Bergmann
| Size | Sample High perf card | SanDisk C2 4GB uSD "A" | Toshiba C2 4GB uSD "B" | Unusable card |
|---|---|---|---|---|
| 4MiB | 8.86M/s | 3.14M/s | 5.84M/s | 15M/s |
| 2MiB | 6.3M/s | 4.09M/s | 3.6M/s | 9.47M/s |
| 1MiB | 5.02M/s | 2.84M/s | 2.21M/s | 4.47M/s |
| 512KiB | 5.16M/s | 1.33M/s | 1.3M/s | 1.61M/s |
| 256KiB | 4.69M/s | 868K/s | 701K/s | 849K/s |
| 128KiB | 3.78M/s | 556K/s | 363K/s | 441K/s |
| 64KiB | 4.62M/s | 297K/s | 186K/s | 226K/s |
| 32KiB | 2.71M/s | 155K/s | 92K/s | 115K/s |
| 16KiB | 2.38M/s | 76K/s | 47K/s | 57K/s |
| 8KiB | 1.24M/s | 38K/s | 23K/s | 23K/s |
| 4KiB | 907K/s | 19K/s | 11.8K/s | 8K/s |
