SDCard Testing: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
|||
| Line 8: | Line 8: | ||
{| class="wikitable" |
{| class="wikitable" |
||
|- |
|- |
||
! |
! Size |
||
! |
! High perf card |
||
! Unusable card |
|||
! unusable |
|||
|- |
|- |
||
| 4MiB |
| 4MiB |
||
Revision as of 15:44, 19 May 2011
This page discusses additional tests for SD Cards. The 'base' tests are described in NAND_Testing.
Sample output
Segment size vs throughput
| Size | High perf card | Unusable card |
|---|---|---|
| 4MiB | 8.86M/s | 15M/s |
| 2MiB | 6.3M/s | 9.47M/s |
| 1MiB | 5.02M/s | 4.47M/s |
| 512KiB | 5.16M/s | 1.61M/s |
| 256KiB | 4.69M/s | 849K/s |
| 128KiB | 3.78M/s | 441K/s |
| 64KiB | 4.62M/s | 226K/s |
| 32KiB | 2.71M/s | 115K/s |
| 16KiB | 2.38M/s | 57K/s |
| 8KiB | 1.24M/s | 23K/s |
| 4KiB | 907K/s | 8K/s |