BoardTestPlan: Difference between revisions
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== NAND == |
== NAND == |
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# Benchmark read/write access on each type of NAND part |
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# |
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# Introduce 1-4 symbol errors in page and verify correct correction. |
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== SD == |
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# Test insertion/detection, hotplug removal. |
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# Test high-speed mode |
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# Benchmark read/write speed on low-speed and high-speed devices |
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# Test MMC and SD devices |
Revision as of 04:24, 25 January 2007
Board test plan
First, note that there are various different combinations of components (SKUs). Items such as the system RAM, the DCON SDRAM, the NAND flash, BIOS SPI flash etc. have multiple sources.
Ensure that each combination, or at least one of each major component with multiple sources, is tested. Bugs do slip through the cracks if you omit even one manufacturer's part from the testing.
DCON
- Check DCON <-> VGA mode transitions. They should be glitchless and an IRQ should arrive promptly.
- Check sleep mode and auto-sleep mode.
- Check ECPWRRQST transition from sleep mode.
- Check blanking.
- Check dot-clock divider setting to request DCON mode refresh frequency
- Check colour, anti-aliasing, monochrome modes. Watch for setup/hold time problems on the display.
- Set backlight to each level 0-15. Check for noise and fluctuations.
NAND
- Benchmark read/write access on each type of NAND part
- Introduce 1-4 symbol errors in page and verify correct correction.
SD
- Test insertion/detection, hotplug removal.
- Test high-speed mode
- Benchmark read/write speed on low-speed and high-speed devices
- Test MMC and SD devices