SDCard Testing

From OLPC
Jump to navigation Jump to search

This page discusses additional tests for SD Cards. The 'base' tests are described in NAND_Testing.


Sample output

Segment size vs throughput

size high perf unusable
4MiB 8.86M/s 15M/s
2MiB 6.3M/s 9.47M/s
1MiB 5.02M/s 4.47M/s
512KiB 5.16M/s 1.61M/s
256KiB 4.69M/s 849K/s
128KiB 3.78M/s 441K/s
64KiB 4.62M/s 226K/s
32KiB 2.71M/s 115K/s
16KiB 2.38M/s 57K/s
8KiB 1.24M/s 23K/s
4KiB 907K/s 8K/s