SDCard Testing

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Revision as of 12:02, 19 May 2011 by Martinlanghoff (talk | contribs) (Sample output)
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This page discusses additional tests for SD Cards. The 'base' tests are described in NAND_Testing.


Sample output

Segment size vs throughput

Size Sample High perf card SanDisk C2 4GB uSD "A" Toshiba C2 4GB uSD "B" Unusable card
4MiB 8.86M/s 3.14M/s 5.84M/s 15M/s
2MiB 6.3M/s 4.09M/s 3.6M/s 9.47M/s
1MiB 5.02M/s 2.84M/s 2.21M/s 4.47M/s
512KiB 5.16M/s 1.33M/s 1.3M/s 1.61M/s
256KiB 4.69M/s 868K/s 701K/s 849K/s
128KiB 3.78M/s 556K/s 363K/s 441K/s
64KiB 4.62M/s 297K/s 186K/s 226K/s
32KiB 2.71M/s 155K/s 92K/s 115K/s
16KiB 2.38M/s 76K/s 47K/s 57K/s
8KiB 1.24M/s 38K/s 23K/s 23K/s
4KiB 907K/s 19K/s 8K/s