XO 1.5 Tests
These are functional tests remaining for the XO 1.5 A1 and A2 motherboards.
List of Tests
| Subsystem Test | OFW | Linux | Notes |
|---|---|---|---|
| Suspend/Resume 1 |  |
 |
Basic manually triggered suspend/resume |
| Suspend/Resume 2 | |
|
Many cycle periodically triggered suspend/resume |
| Storage Suspend/Resume | |
|
Testing SD storage integrity |
| Storage Error Rate | |
|
Testing SD storage bit error rate |
| SD/MMC Port Testing | |
|
Testing SD/MMC driver on Via demo board |
| Video Capture | |
|
Trac #9377 |
| Lid Switch | |
|
Works as input device. Haven't tested sleep/wake function. |
| EBook Switch | |
|
ACPI sees transitions. |
| I2C Communications with Clock Generator | |
|
decreases power consumption |
| EC Control of Charge Current | |
|
|
| USB Power | |
|
Trac #9366 |
Suspend/Resume 2 Tests
This is a repeated suspend of the motherboard, followed by a resume triggered by a asynchronous (and worst case) EC event. It performs the test using Open Firmware tests.
Procedure
Obtain an Open Firmware prompt on the laptop. Type:
22 wackup-test-ec
When you have to stop the test, record the cycle number and reboot. Please record the number below, along with any information about a crash of some sort during this test.
Results
| Motherboard | Num. Consecutive Passes | Crash ? | Notes |
|---|---|---|---|
| 1 | 448230 | no crash | |
| 45 | 496600 | no crash | |
| 43 | 512500 | no crash | |
| 43 | 355500 | no crash | |
| 11 | 150000 | no crash | |
| 11 | 805400 | no crash | |
| 31 | 105400 | no crash | |
| 6 | 178000 | no crash |
All A2 motherboards pass at least 1000 cycles of suspend/resume testing after having the SR ECO applied.
| Motherboard | Num. Consecutive Passes | Crash ? | Notes |
|---|---|---|---|
| CJB | 241300 | no crash | consistent DCON timeouts |
| Isabel | 24000 | ||
| Isabel | 19000 | ||
| Isabel | 196000 | ||
| Graham | 237000 | no crash | regular DCON timeouts |
| CJB | 196000 | Using 20 wackup-test-ec ! No timeouts using 19 mS DCONLOAD pulse width |
Storage Suspend Test
This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.
Storage Error Rate
This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the testing of NAND storage devices on XO-1. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the same tests on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.
EC Control of Charge Current
We need to verify that the EC can indeed modify the charge current of the laptop.
We failed this test. We can influence the charge current, but only in the wrong direction. Additional work is needed.