XO 1.5 Tests: Difference between revisions
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| {{no}} || {{no}} || [http://dev.laptop.org/ticket/9366 Trac #9366] |
| {{no}} || {{no}} || [http://dev.laptop.org/ticket/9366 Trac #9366] |
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The following tests need to be performed: |
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=== Storage Suspend Tests === |
=== Storage Suspend Tests === |
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This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop. |
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=== Storage Error Rate === |
=== Storage Error Rate === |
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This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the [[NAND_Testing|testing of NAND storage devices on XO-1]]. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the [[NAND_Testing|same tests]] on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype. |
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=== EC Control of Charge Current === |
=== EC Control of Charge Current === |
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We need to verify that the EC can indeed modify the charge current of the laptop. |
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[[Category:Hardware]] |
[[Category:Hardware]] |
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Revision as of 04:27, 25 June 2009
These are functional tests remaining for the XO 1.5 A1 motherboard.
| Subsystem Test | OFW | Linux | Notes |
|---|---|---|---|
| Suspend/Resume 1 |  |
 |
Basic manually triggered suspend/resume |
| Suspend/Resume 2 | |
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Many cycle periodically triggered suspend/resume |
| Storage Suspend/Resume | |
|
Testing SD storage integrity |
| Storage Error Rate | |
|
Testing SD storage bit error rate |
| Video Capture | |
|
Trac #9377 |
| Lid Switch | |
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| EBook Switch | |
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| I2C Communications with Clock Generator | |
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decreases power consumption |
| EC Control of Charge Current | |
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| USB Power | |
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Trac #9366 |
The following tests need to be performed:
Storage Suspend Tests
This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.
Storage Error Rate
This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the testing of NAND storage devices on XO-1. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the same tests on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.
EC Control of Charge Current
We need to verify that the EC can indeed modify the charge current of the laptop.