XO 1.5 Tests: Difference between revisions

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{{OLPC}}
{{OLPC}}
These are functional tests remaining for the [[XO 1.5 A1]] motherboard.
These are functional tests remaining for the [[XO 1.5 A1]] and [[XO_1.5_A2|A2]] motherboards.

== List of Tests ==


{| border="1" align="center"
{| border="1" align="center"
|+ '''Bringup status'''
|+ '''XO-1.5 A1 Prototype Test Status'''
! Subsystem Test !! OFW !! Linux !! Notes
! Subsystem Test !! OFW !! Linux !! Notes
|- align="center"
|- align="center"
Line 10: Line 12:
|- align="center"
|- align="center"
! Suspend/Resume 2
! Suspend/Resume 2
| {{no}} || {{no}} || Many cycle periodically triggered suspend/resume
| {{yes}} || {{no}} || Many cycle periodically triggered suspend/resume
|- align="center"
|- align="center"
! Storage Suspend/Resume
! Storage Suspend/Resume
Line 16: Line 18:
|- align="center"
|- align="center"
! Storage Error Rate
! Storage Error Rate
| {{no}} || {{no}} || Testing SD storage bit error rate
| {{no}} || {{yes}} || Testing SD storage bit error rate
|- align="center"
! SD/MMC Port Testing
| {{no}} || {{no}} || Testing SD/MMC driver on Via demo board
|- align="center"
|- align="center"
! Video Capture
! Video Capture
Line 22: Line 27:
|- align="center"
|- align="center"
! Lid Switch
! Lid Switch
| {{no}} || {{no}} ||
| {{no}} || {{yes}} || Works as input device. Haven't tested sleep/wake function.
|- align="center"
|- align="center"
! EBook Switch
! EBook Switch
| {{no}} || {{no}} ||
| {{no}} || {{yes}} || ACPI sees transitions.
|- align="center"
|- align="center"
! I2C Communications with Clock Generator
! I2C Communications with Clock Generator
Line 34: Line 39:
|- align="center"
|- align="center"
! USB Power
! USB Power
| {{no}} || {{no}} || [http://dev.laptop.org/ticket/9366 Trac #9366]
| {{yes}} || {{yes}} || [http://dev.laptop.org/ticket/9366 Trac #9366]
|}
|}

== Suspend/Resume 2 Tests ==

This is a repeated suspend of the motherboard, followed by a resume triggered by a asynchronous (and worst case) [[Embedded_controller|EC]] event. It performs the test using [[Suspend_and_resume_OFW|Open Firmware tests]].

===Procedure===

Obtain an [[Open Firmware]] prompt on the laptop. Type:
22 wackup-test-ec

When you have to stop the test, record the cycle number and reboot. Please record the number below, along with any information about a crash of some sort during this test.

===Results===

{| border="1" align="center"
|+ '''XO-1.5 A2 Prototype Test Status'''
! Motherboard !! Num. Consecutive Passes !! Crash ? !! Notes
|- align="center"
! 1
| 448230 || no crash ||
|- align="center"
! 45
| 496600 || no crash ||
|- align="center"
! 43
| 512500 || no crash ||
|- align="center"
! 43
| 355500 || no crash ||
|- align="center"
! 11
| 150000 || no crash ||
|- align="center"
! 11
| 805400 || no crash ||
|- align="center"
! 31
| 105400 || no crash ||
|- align="center"
! 6
| 178000 || no crash ||
|- align="center"
|}

All A2 motherboards pass at least 1000 cycles of suspend/resume testing after having the [[XO1.5_1.2V_power_sequencing_ECO|SR ECO]] applied.

{| border="1" align="center"
|+ '''XO-1.5 A1 Prototype Test Status'''
! Motherboard !! Num. Consecutive Passes !! Crash ? !! Notes
|- align="center"
! CJB
| 241300 || no crash || consistent DCON timeouts
|- align="center"
| Isabel
| 24000 || ||
|- align="center"
! Isabel
| 19000 || ||
|- align="center"
! Isabel
| 196000 || ||
|- align="center"
! Graham
| 237000 || no crash || regular DCON timeouts
|- align="center"
! CJB
| 196000 || || Using 20 wackup-test-ec ! No timeouts using 19 mS DCONLOAD pulse width
|}

== Storage Suspend Test ==

This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.

== Storage Error Rate ==

This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the [[NAND_Testing|testing of NAND storage devices on XO-1]]. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the [[NAND_Testing|same tests]] on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.

== EC Control of Charge Current ==

We need to verify that the EC can indeed modify the charge current of the laptop.

''We failed this test. We can influence the charge current, but only in the wrong direction. Additional work is needed.''




[[Category:XO-1.5]]
[[Category:Hardware]]
[[Category:Hardware]]

Latest revision as of 05:43, 9 August 2009

  This page is monitored by the OLPC team.

These are functional tests remaining for the XO 1.5 A1 and A2 motherboards.

List of Tests

XO-1.5 A1 Prototype Test Status
Subsystem Test OFW Linux Notes
Suspend/Resume 1 Yes.pngY No.pngY Basic manually triggered suspend/resume
Suspend/Resume 2 Yes.pngY No.pngY Many cycle periodically triggered suspend/resume
Storage Suspend/Resume No.pngY No.pngY Testing SD storage integrity
Storage Error Rate No.pngY Yes.pngY Testing SD storage bit error rate
SD/MMC Port Testing No.pngY No.pngY Testing SD/MMC driver on Via demo board
Video Capture No.pngY No.pngY Trac #9377
Lid Switch No.pngY Yes.pngY Works as input device. Haven't tested sleep/wake function.
EBook Switch No.pngY Yes.pngY ACPI sees transitions.
I2C Communications with Clock Generator No.pngY No.pngY decreases power consumption
EC Control of Charge Current No.pngY No.pngY
USB Power Yes.pngY Yes.pngY Trac #9366

Suspend/Resume 2 Tests

This is a repeated suspend of the motherboard, followed by a resume triggered by a asynchronous (and worst case) EC event. It performs the test using Open Firmware tests.

Procedure

Obtain an Open Firmware prompt on the laptop. Type: 

22 wackup-test-ec

When you have to stop the test, record the cycle number and reboot. Please record the number below, along with any information about a crash of some sort during this test.

Results

XO-1.5 A2 Prototype Test Status
Motherboard Num. Consecutive Passes Crash ? Notes
1 448230 no crash
45 496600 no crash
43 512500 no crash
43 355500 no crash
11 150000 no crash
11 805400 no crash
31 105400 no crash
6 178000 no crash

All A2 motherboards pass at least 1000 cycles of suspend/resume testing after having the SR ECO applied.

XO-1.5 A1 Prototype Test Status
Motherboard Num. Consecutive Passes Crash ? Notes
CJB 241300 no crash consistent DCON timeouts
Isabel 24000
Isabel 19000
Isabel 196000
Graham 237000 no crash regular DCON timeouts
CJB 196000 Using 20 wackup-test-ec ! No timeouts using 19 mS DCONLOAD pulse width

Storage Suspend Test

This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.

Storage Error Rate

This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the testing of NAND storage devices on XO-1. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the same tests on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.

EC Control of Charge Current

We need to verify that the EC can indeed modify the charge current of the laptop.

We failed this test. We can influence the charge current, but only in the wrong direction. Additional work is needed.

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