XO 1.5 Tests: Difference between revisions
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== Suspend/Resume 2 Tests == |
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This is a repeated suspend of the motherboard, followed by a resume triggered by a RTC event. It performs the test in Open Firmware. |
This is a repeated suspend of the motherboard, followed by a resume triggered by a RTC event. It performs the test in Open Firmware. |
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== Storage Suspend Test == |
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This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop. |
This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop. |
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== Storage Error Rate == |
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This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the [[NAND_Testing|testing of NAND storage devices on XO-1]]. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the [[NAND_Testing|same tests]] on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype. |
This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the [[NAND_Testing|testing of NAND storage devices on XO-1]]. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the [[NAND_Testing|same tests]] on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype. |
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== EC Control of Charge Current == |
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We need to verify that the EC can indeed modify the charge current of the laptop. |
We need to verify that the EC can indeed modify the charge current of the laptop. |
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''We failed this test. We can influence the charge current, but only in the wrong direction. Additional work is needed.'' |
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[[Category:Hardware]] |
[[Category:Hardware]] |
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Revision as of 23:39, 27 June 2009
These are functional tests remaining for the XO 1.5 A1 motherboard.
List of Tests
| Subsystem Test | OFW | Linux | Notes |
|---|---|---|---|
| Suspend/Resume 1 |  |
 |
Basic manually triggered suspend/resume |
| Suspend/Resume 2 | |
|
Many cycle periodically triggered suspend/resume |
| Storage Suspend/Resume | |
|
Testing SD storage integrity |
| Storage Error Rate | |
|
Testing SD storage bit error rate |
| SD/MMC Port Testing | |
|
Testing SD/MMC driver on Via demo board |
| Video Capture | |
|
Trac #9377 |
| Lid Switch | |
|
|
| EBook Switch | |
|
|
| I2C Communications with Clock Generator | |
|
decreases power consumption |
| EC Control of Charge Current | |
|
|
| USB Power | |
|
Trac #9366 |
Suspend/Resume 2 Tests
This is a repeated suspend of the motherboard, followed by a resume triggered by a RTC event. It performs the test in Open Firmware.
| Motherboard | Num. Consecutive Passes | Crash ? | Notes |
|---|---|---|---|
| Isabel | 24000 | ||
| Isabel | 19000 | ||
| Isabel | 49000 | Still in progress |
Storage Suspend Test
This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.
Storage Error Rate
This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the testing of NAND storage devices on XO-1. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the same tests on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.
EC Control of Charge Current
We need to verify that the EC can indeed modify the charge current of the laptop.
We failed this test. We can influence the charge current, but only in the wrong direction. Additional work is needed.