XO 1.5 Tests
These are functional tests remaining for the XO 1.5 A1 motherboard.
| Motherboard | Num. Consecutive Passes | Crash ? | Notes |
|---|---|---|---|
| Isabel | 19000 | ||
| Isabel | 49000 | Still in progress |
Storage Suspend Tests
This test exercises the reliability of an SD storage device while continually suspending and resuming the laptop.
Storage Error Rate
This test attempts to measure the bit error rate of the SD interface on the XO-1.5. The SD interface, and not the SD cards themselves, have been implicated in a number of errors across the testing of NAND storage devices on XO-1. We need to both verify that this is really the case and also verify that the SD interface on the XO-1.5 is rock-solid. I propose running the same tests on any idle XO-1.5 prototype to accumulate more data. Contact wad for an SD card and instructions if you have an A1 prototype.
EC Control of Charge Current
We need to verify that the EC can indeed modify the charge current of the laptop.